Kelvin Probe – Bilgi Türkçe

KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies.
KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the work function or surface potential evaluation of client samples. Along with a strong research and development division and over 500 systems shipped worldwide, this has placed KP Technology as the leading supplier of Kelvin probes in the world.

Kelvin Probe Systems

Our solution partner KP Technology is an award-winning company which designs and manufactures Kelvin Probe systems for work function and surface potential measurements. KP Technology and Fotonika supply state-of-the-art equipment and consultancy services to innovative companies and research institutes throughout the world. KP Technology and Fotonika’s in-house teaching laboratories ensure you get the best from your system.

The Kelvin Probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The wf of a surface is typically defined by the topmost 1-3 layers of atoms or molecules, so the Kelvin Probe is one of the most sensitive surface analysis techniques available. KP Technology Systems offer very high wf resolution of 1-3 meV, currently the highest achieved by any commercial device.

The Kelvin Probe does not actually touch the surface; rather an electrical contact is made to another part of the sample or sample holder. The probe tip is typically 0.2 – 2.0 mm away from the sample and it measures the ‘traditional work function’, i.e. that found in literature tables. Other techniques, using very sharp tips some 10’s of nanometers away from the sample, measure very reduced and distorted work functions due to the close separation of tip and sample.

For semiconductor surfaces, both organic (Polymer) and inorganic (Si, Ge, CdS, etc) the Kelvin Probe is the only way to directly measure the Fermi-level. Changes in Fermi-level, caused by illumination with white or monochromatic light, results in energy band shifts which can be used to characterize interface and bulk defect states. These techniques are termed Surface Photovoltage (SPV) and Surface Photovoltage Spectroscopy (SPS) for which KP Technology can supply both software and accessories for our systems.

Eylül 2021
  1 2 3 4 5
6 7 8 9 10 11 12
13 14 15 16 17 18 19
20 21 22 23 24 25 26
27 28 29 30